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Volumn 384, Issue 1-3, 1997, Pages 276-282

A comparative study of the thermal stability of the (103) surface of group-III-metal/group-IV-semiconductor systems

Author keywords

Aluminum; Faceting; Gallium; Germanium; Indium; Low energy electron diffraction; Silicon; Surface reconstruction

Indexed keywords

ALUMINUM; AUGER ELECTRON SPECTROSCOPY; CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; LOW ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING GALLIUM; SEMICONDUCTING GERMANIUM; SEMICONDUCTING INDIUM; SEMICONDUCTING SILICON; SURFACE PHENOMENA; SURFACE STRUCTURE;

EID: 0031191461     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00233-1     Document Type: Article
Times cited : (16)

References (17)
  • 1
    • 0027038172 scopus 로고
    • and the references therein
    • See, for example, J.P. LaFemina, Surf. Sci. Report, 16 (1992) 133, and the references therein.
    • (1992) Surf. Sci. Report , vol.16 , pp. 133
    • LaFemina, J.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.