The rôle of defects in photographic latent image formation

Materials Research Society Symposium Proceedings

Volumn 848, Issue , 2005, Pages 351-356

  Wilson, D J ^a   Sokol, A A ^a   French, S A ^a   Catlow, C R A ^a  

^a DAVY FARADAY RESEARCH LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

LOCALIZATION OF PHOTOELECTRON; QM/MM EMBEDDING METHOD; SILVER CHLORIDE;

CHLORINE COMPOUNDS; CRYSTAL LATTICES; PROCESS CONTROL; SILVER COMPOUNDS;

IMAGE PROCESSING;

EID: 28844464044     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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