Characterization of off-axis MgB 2 epitaxial thin films for planar junctions

Applied Physics Letters

Volumn 87, Issue 24, 2005, Pages 1-3

  Iavarone, M ^a   Karapetrov, G ^a   Menzel, A ^a   Komanicky, V ^a   You, H ^a   Kwok, W K ^a   Orgiani, P ^b,c   Ferrando, V ^b,d   Xi, X X ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c INFM   (Italy)

^d UNIVERSITY OF GENOA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL TEMPERATURES; SCANNING TUNNELING SPECTROSCOPY;

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; EPITAXIAL GROWTH; SCANNING TUNNELING MICROSCOPY; TEMPERATURE DISTRIBUTION; THIN FILMS; X RAY ANALYSIS; YTTRIUM COMPOUNDS;

MAGNESIUM COMPOUNDS;

EID: 28844461095     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2140473     Document Type: Article

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