Test of clock model in ellipsometric study of thin and thick free-standing films of an antiferroelectric liquid crystal

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 72, Issue 5, 2005, Pages

  Conradi, M ^a   Cepic M ^a,b   Copic M ^a,b   Musevic I ^a,b  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b UNIVERSITY OF LJUBLJANA   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

CLOCK MODEL; DISCRETE PHENOMENOLOGICAL MODEL; ELLIPSOMETRIC PARAMETERS; FREE-STANDING FILMS;

ANTIFERROELECTRIC MATERIALS; LIQUID CRYSTALS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; THICK FILMS; THIN FILMS;

ELLIPSOMETRY;

EID: 28844453356     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.72.051711     Document Type: Article

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