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Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 64, Issue 2, 2001, Pages 217021-217028

Structure of freely suspended chiral smectic films as determined by x-ray reflectivity and optical ellipsometry

(6) Fera, A a Opitz, R a De Jeu, W H a Ostrovskii, B I b Schlauf, D c Bahr, Ch c

a FOM INSTITUTE AMOLF (Netherlands)

b SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY (Russian Federation)

c PHILIPPS UNIVERSITY MARBURG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELLIPSOMETRY; INTERFACES (MATERIALS); MATHEMATICAL MODELS; PHASE TRANSITIONS; SUPERLATTICES; X RAY SCATTERING;

CHIRAL SMECTIC FILMS;

SMECTIC LIQUID CRYSTALS;

EID: 0035420178 PISSN: 15393755 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevE.64.021702 Document Type: Article

Times cited : (21)

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