Scanning tunneling microscopy and surface simulation of zinc-blende GaN(001) intrinsic 4× reconstruction: Linear gallium tetramers?

Physical Review Letters

Volumn 95, Issue 14, 2005, Pages

  Al Brithen, Hamad A H ^a   Yang, Rong ^a   Haider, Muhammad B ^a   Constantin, Costel ^a   Lu, Erdong ^a   Smith, Arthur R ^a   Sandler, Nancy ^a,b   Ordejón, Pablo ^a,b  

^a OHIO UNIVERSITY   (United States)

^b CSIC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM TETRAMERS; HIGH-RESOLUTION IMAGES; SURFACE BAND GAPS; SURFACE SIMULATIONS;

CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; ELECTRONIC STRUCTURE; GALLIUM NITRIDE; MATHEMATICAL MODELS; SCANNING TUNNELING MICROSCOPY; SURFACE PHENOMENA;

ZINC ALLOYS;

EID: 28844444641     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.95.146102     Document Type: Article

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