Electron trapping and interface trap generation in drain extended pMOS transistors

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2005, Pages 555-559

  Moens, P ^a   Bauwens, F ^a   Nelson, M ^a   Tack, M ^a  

^a ON SEMICONDUCTOR   (United States)

Author keywords

Charge pumping; DeMOS; Hot carrier; Interface trap generation; Oxide traps

Indexed keywords

CHARGE PUMPING; DEMOS; INTERFACE TRAP GENERATION; OXIDE TRAPS;

ELECTRIC CHARGE; ELECTRIC RESISTANCE; ELECTRONS; HOT CARRIERS; OPTICAL PUMPING; STRESS ANALYSIS;

MOSFET DEVICES;

EID: 28744454313     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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