Debugging sequential circuits using boolean satisfiability

Proceedings - International Workshop on Microprocessor Test and Verification

Volumn , Issue , 2005, Pages 44-49

  Ali, Moayad Fahim ^a   Veneris, Andreas ^a   Safarpour, Sean ^a   Abadir, Magdy ^b   Drechsler, Rolf ^c   Smith, Alexander ^a  

^a UNIVERSITY OF TORONTO   (Canada)

^b FREESCALE SEMICONDUCTOR INC   (United States)

^c UNIVERSITY OF BREMEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BOOLEAN SATISFIABILITY; LARGE CIRCUITS; LOGIC DEBUGGING;

BOOLEAN ALGEBRA; COMPUTATIONAL COMPLEXITY; ERROR DETECTION; PROGRAM DEBUGGING; ROBUSTNESS (CONTROL SYSTEMS);

SEQUENTIAL CIRCUITS;

EID: 28744444186     PISSN: 15504093     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTV.2004.7     Document Type: Conference Paper

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