Error diagnosis of sequential circuits using region-based model

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 2001, Pages 103-108

  D'Souza, Anand L ^a   Hsiao, Michael S ^b  

^a SUN MICROSYSTEMS   (United States)

^b RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; ERROR ANALYSIS; MATHEMATICAL MODELS; VECTORS;

MULTIPLE STUCK FAULTS; REGION-BASED ERROR MODELS;

SEQUENTIAL CIRCUITS;

EID: 0035020666     PISSN: 10639667     EISSN: None     Source Type: Journal    
DOI: 10.1109/ICVD.2001.902647     Document Type: Article

References (0)