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Volumn 82, Issue 7, 2005, Pages 441-443

EPR identification of the triplet ground state and photoinduced population inversion for a Si-C divacancy in silicon carbide

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EID: 28744440591     PISSN: 00213640     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.2142873     Document Type: Article
Times cited : (90)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.