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Volumn 87, Issue 12, 2005, Pages 1-3

Meyer-Neldel rule and the influence of entropy on capture cross-section determination in Cu (In,Ga) Se 2

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE-CARRIER EMISSION; ELEMENTAL EVAPORATION; MEYER-NELDEL RULE (MNR);

EID: 28344454498     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2051796     Document Type: Article
Times cited : (14)

References (23)
  • 2
    • 28344437829 scopus 로고    scopus 로고
    • 31st IEEE Photovoltaic Specialists Conference, Lake Buena Vista, Florida
    • J. AbuShama, R. Noufi, S. Johnston, S. Ward, and X. Wu, presented at the 31st IEEE Photovoltaic Specialists Conference, Lake Buena Vista, Florida, 2005.
    • (2005)
    • Abushama, J.1    Noufi, R.2    Johnston, S.3    Ward, S.4    Wu, X.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.