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Volumn 87, Issue 17, 2005, Pages 1-3

Atomically flat aluminum-oxide barrier layers constituting magnetic tunnel junctions observed by in situ scanning tunneling microscopy

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ELECTRON SCATTERING; ELECTRON TUNNELING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING ALUMINUM COMPOUNDS;

EID: 28344446385     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2108121     Document Type: Article
Times cited : (10)

References (16)
  • 1
    • 0029632353 scopus 로고
    • 0304-8853 10.1016/0304-8853(95)90001-2
    • T. Miyazaki and N. Tezuka, J. Magn. Magn. Mater. 0304-8853 10.1016/0304-8853(95)90001-2 139, L231 (1995); J. S. Moodera, L. R. Kinder, T. M. Wong, and R. Meservey, Phys. Rev. Lett. 74, 3273 (1995).
    • (1995) J. Magn. Magn. Mater. , vol.139 , pp. 231
    • Miyazaki, T.1    Tezuka, N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.