Surface band structure studies of Si rich reconstructions on 4H-SiC(11̄00)

Materials Science Forum

Volumn 483-485, Issue , 2005, Pages 547-550

  Emtsev, K V ^a   Seyller, Th ^a   Ley, L ^a   Tadich, A ^b   Broekman, L ^b   Huwald, E ^b   Riley, J D ^b   Leckey, R G C ^b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b LA TROBE UNIVERSITY   (Australia)

Author keywords

A planes; Photoelectron spectroscopy; Reconstruction

Indexed keywords

LOW ENERGY ELECTRON DIFFRACTION; THERMAL EFFECTS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE RESOLVED ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY (ARUPS); RECONSTRUCTION; SURFACE BAND STRUCTURE;

BAND STRUCTURE;

EID: 28244442967     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-963-6.547     Document Type: Conference Paper

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