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Volumn 351, Issue 52-54, 2005, Pages 3809-3815
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Preparation and characterization of SrTiO3/BaTiO3 thin multilayer films deposited on Pt/Ti/SiO2/Si substrate by radio frequency magnetron sputtering
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Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
ELECTRON DIFFRACTION;
MAGNETRON SPUTTERING;
POLARIZATION;
SCANNING ELECTRON MICROSCOPY;
STRONTIUM COMPOUNDS;
SUBSTRATES;
X RAY DIFFRACTION;
COERCIVE FIELD;
DOUBLE TARGET RADIO FREQUENCY;
ELECTRIC FIELD HYSTERESIS LOOP;
MULTILAYER STRUCTURE;
REMANENT POLARIZATION REMANENT POLARIZATION;
THIN FILMS;
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EID: 28244439290
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2005.10.014 Document Type: Article |
Times cited : (9)
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References (20)
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