The next generation refrigerated (cryogenic) electron beam ion trap-source (REBIT-S)

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 241, Issue 1-4, 2005, Pages 870-873

  McDonald, Joseph W ^a   Schneider, Dieter H G ^a  

^a P and T   (United States)

Author keywords

Electron beam ion trap (EBIT); Highly charged ions

Indexed keywords

COOLING; CRYOGENICS; CURRENT DENSITY; IONS; POTENTIAL ENERGY; REFRIGERATION; SUPERCONDUCTING MAGNETS;

ELECTRON BEAM ION TRAPS (EBIT); HIGHLY CHARGED ION BEAMS; HIGHLY CHARGED IONS; ION YIELDS;

ELECTRON BEAMS;

EID: 28044446754     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.07.143     Document Type: Conference Paper

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