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Volumn 495, Issue 1-2, 2006, Pages 124-129
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Crosslinking impact of mesoporous MSQ films used in microelectronic interconnections on mechanical properties
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Author keywords
Crosslinking; FTIR; Low k; Mechanical properties; MSQ; Nanoindentation; Spin on; ULK
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Indexed keywords
CORRELATION THEORY;
CROSSLINKING;
ELLIPSOMETRY;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
INTEGRATED CIRCUITS;
MECHANICAL PROPERTIES;
MICROELECTRONICS;
LOW-K;
METHYLSILSESQUIOXANE (MSQ);
NANOINDENTATION;
SPIN-ON;
ULK;
THIN FILMS;
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EID: 28044444592
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2005.08.291 Document Type: Conference Paper |
Times cited : (41)
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References (15)
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