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Volumn 49, Issue 11 SPEC. ISS., 2005, Pages 1799-1804
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NVM based on FinFET device structures
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Author keywords
Charge trapping memory; FinFET; Flash; NROM; NVM; SONOS; Tri gate transistor
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Indexed keywords
COMPUTER PROGRAMMING;
DATA REDUCTION;
ENERGY UTILIZATION;
GATES (TRANSISTOR);
LOGIC DEVICES;
SILICON ON INSULATOR TECHNOLOGY;
SILICON WAFERS;
CHARGE TRAPPING MEMORIES;
FINFET;
FLASH;
NROM;
NVM;
SONOS;
TRI-GATE TRANSISTORS;
FLASH MEMORY;
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EID: 28044440486
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/j.sse.2005.10.012 Document Type: Article |
Times cited : (16)
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References (7)
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