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Volumn , Issue , 2005, Pages 259-262

Unusual capacitance emission transients in CIGS caused by large defect entropy changes

Author keywords

[No Author keywords available]

Indexed keywords

BIAS-PULSE EXPERIMENTS; CAPACITANCE EMISSION; CARRIER EMISSION;

EID: 27944481804     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (19)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.