Ellipsometry and AFM study of post-deposition transformations in vacuum-evaporated As-S-Se films

Journal of Optoelectronics and Advanced Materials

Volumn 7, Issue 5, 2005, Pages 2255-2266

  Sopinskyy, M V ^a   Shepeliavyi, P E ^a   Stronski, A V ^a   Venger, E F ^a  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

As S Se films; Ellipsometry; Post deposition transformations

Indexed keywords

DEPOSITION; ELLIPSOMETRY; MASS TRANSFER; MORPHOLOGY; REFRACTIVE INDEX; SELENIUM COMPOUNDS; THERMAL EVAPORATION;

ELLIPSOMETRICAL PARAMETERS; EVOLUTION PROCESS; LABORATORY CONDITIONS; MEASUREMENTS OF; MIDDLE RANGE ORDERING; PHYSICAL ANALYSIS; POST-DEPOSITION; TIME DEPENDENCE;

SULFUR COMPOUNDS;

EID: 27944475979     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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