-
1
-
-
0030392062
-
Redundancy identification using transitive closure
-
November
-
V. D. Agrawal, M. L. Bushnell, and Q. Lin, "Redundancy Identification Using Transitive Closure," in Proc. of the 5th Asian Test Symp., November 1996, pp. 4-9.
-
(1996)
Proc. of the 5th Asian Test Symp.
, pp. 4-9
-
-
Agrawal, V.D.1
Bushnell, M.L.2
Lin, Q.3
-
4
-
-
0031163938
-
A functional decomposition method for redundancy identification and test generation
-
June
-
M. L. Bushnell and J. Giraldi, "A Functional Decomposition Method for Redundancy Identification and Test Generation," Journal of Electronic Testing: Theory and Applications, vol. 10, no. 3, pp. 175-195, June 1997.
-
(1997)
Journal of Electronic Testing: Theory and Applications
, vol.10
, Issue.3
, pp. 175-195
-
-
Bushnell, M.L.1
Giraldi, J.2
-
6
-
-
0025508803
-
Neural net and boolean satisfiability models of logic circuits
-
October
-
S. T. Chakradhar, V. D. Agrawal, and M. L. Bushnell, "Neural Net and Boolean Satisfiability Models of Logic Circuits," IEEE Design and Test of Computers, vol. 7, no. 5, pp. 54-57, October 1990.
-
(1990)
IEEE Design and Test of Computers
, vol.7
, Issue.5
, pp. 54-57
-
-
Chakradhar, S.T.1
Agrawal, V.D.2
Bushnell, M.L.3
-
8
-
-
0027634569
-
A transitive closure algorithm for test generation
-
July
-
S. T. Chakradhar, V. D. Agrawal, and S. G. Rothweiler, "A Transitive Closure Algorithm for Test Generation," IEEE Trans. on Computer-Aided Design, vol. 12, no. 7, pp. 1015-1028, July 1993.
-
(1993)
IEEE Trans. on Computer-aided Design
, vol.12
, Issue.7
, pp. 1015-1028
-
-
Chakradhar, S.T.1
Agrawal, V.D.2
Rothweiler, S.G.3
-
9
-
-
0024171865
-
Automatic test generation using neural networks
-
November
-
S. T. Chakradhar, M. L. Bushnell, and V. D. Agrawal, "Automatic Test Generation Using Neural Networks," in Proc. of the International Conf. on Computer-Aided Design, November 1988, pp. 416-419.
-
(1988)
Proc. of the International Conf. on Computer-aided Design
, pp. 416-419
-
-
Chakradhar, S.T.1
Bushnell, M.L.2
Agrawal, V.D.3
-
14
-
-
0011798214
-
A new transitive closure algorithm with applications to redundancy identification
-
January
-
V. Gaur, V. D. Agrawal, and M. L. Bushnell, "A New Transitive Closure Algorithm with Applications to Redundancy Identification," in Proc. of the 1st International Workshop on Electronic, Design and Test Applications (DELTA'02), January 2002, pp. 496-500.
-
(2002)
Proc. of the 1st International Workshop on Electronic, Design and Test Applications (DELTA'02)
, pp. 496-500
-
-
Gaur, V.1
Agrawal, V.D.2
Bushnell, M.L.3
-
15
-
-
0019543877
-
An implicit enumeration algorithm to generate tests for combinational logic circuits
-
March
-
P. Goel, "An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits," IEEE Trans. on Computers, vol. C-30, no. 3, pp. 215-222, March 1981.
-
(1981)
IEEE Trans. on Computers
, vol.C-30
, Issue.3
, pp. 215-222
-
-
Goel, P.1
-
16
-
-
0018524018
-
Controllbility/observability analysis of digital circuits
-
September
-
L. H. Goldstein, "Controllbility/Observability Analysis of Digital Circuits," IEEE Trans. on Circuits and Systems, vol. CAS-26, no. 9, pp. 685-693, September 1979.
-
(1979)
IEEE Trans. on Circuits and Systems
, vol.CAS-26
, Issue.9
, pp. 685-693
-
-
Goldstein, L.H.1
-
18
-
-
0029223051
-
A new data structure to solve the satisfiability problem in digital circuits
-
January
-
M. Henftling and H. Wittmann, "A New Data Structure to Solve the Satisfiability Problem in Digital Circuits," Archiv fiir Elecktronik Und Obertragungstechnik, vol. 49, no. 1, pp. 29-43, January 1995.
-
(1995)
Archiv Fiir Elecktronik und Obertragungstechnik
, vol.49
, Issue.1
, pp. 29-43
-
-
Henftling, M.1
Wittmann, H.2
-
20
-
-
0030166346
-
FIRE: A fault-independent combinational Redundancy identification algorithm
-
June
-
M. A. Iyer and M. Abramovici, "FIRE: A Fault-Independent Combinational Redundancy Identification Algorithm," IEEE Transactions on VLSI Systems, vol. 4, no. 2, pp. 295-301, June 1996.
-
(1996)
IEEE Transactions on VLSI Systems
, vol.4
, Issue.2
, pp. 295-301
-
-
Iyer, M.A.1
Abramovici, M.2
-
22
-
-
84961249468
-
Recursive learning: An attractive alternative to the decision tree for test generation in digital circuits
-
September
-
W. Kunz and D. K. Pradhan, "Recursive Learning: An Attractive Alternative to the Decision Tree for Test Generation in Digital Circuits," in Proc. of the IEEE International Test Conf., September 1992, pp. 816-825.
-
(1992)
Proc. of the IEEE International Test Conf.
, pp. 816-825
-
-
Kunz, W.1
Pradhan, D.K.2
-
23
-
-
0024913660
-
Efficient generation of test patterns using boolean difference
-
August
-
T. Larrabee, "Efficient Generation of Test Patterns Using Boolean Difference," in Proc. of the International Test Conf., August 1989, pp. 795-801.
-
(1989)
Proc. of the International Test Conf.
, pp. 795-801
-
-
Larrabee, T.1
-
24
-
-
0026623575
-
Test pattern generation using boolean satisfiability
-
January
-
T. Larrabee, "Test Pattern Generation Using Boolean Satisfiability," IEEE Transactions on Computer-Aided Design, vol. 11, no. 1, pp. 4-15, January 1992.
-
(1992)
IEEE Transactions on Computer-aided Design
, vol.11
, Issue.1
, pp. 4-15
-
-
Larrabee, T.1
-
26
-
-
27944493715
-
-
Master's thesis, Rutgers University, ECE Dept., Piscataway, New Jersey, May
-
V. J. Mehta, "Redundancy Identification in Logic Circuits using Extended Implication Graph and Stem Unobservability Theorems," Master's thesis, Rutgers University, ECE Dept., Piscataway, New Jersey, May 2003.
-
(2003)
Redundancy Identification in Logic Circuits Using Extended Implication Graph and Stem Unobservability Theorems
-
-
Mehta, V.J.1
-
29
-
-
0028429646
-
Redundancy identification and removal in combinational circuits
-
May
-
P. R. Menon, H. Ahuja, and M. Harihara, "Redundancy Identification and Removal in Combinational Circuits," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 13, no. 5, pp. 646-651, May 1994.
-
(1994)
IEEE Trans. on Computer-aided Design of Integrated Circuits and Systems
, vol.13
, Issue.5
, pp. 646-651
-
-
Menon, P.R.1
Ahuja, H.2
Harihara, M.3
-
30
-
-
0020303447
-
VICTOR: A fast VLSI testability analysis program
-
November
-
I. M. Ratiu, A. Sangiovanni-Vincentelli, and D. O. Pederson, "VICTOR: A Fast VLSI Testability Analysis Program," in Proc. of the IEEE International Test Conference, November 1982, pp. 397-401.
-
(1982)
Proc. of the IEEE International Test Conference
, pp. 397-401
-
-
Ratiu, I.M.1
Sangiovanni-Vincentelli, A.2
Pederson, D.O.3
-
31
-
-
0001413253
-
Diagonosis of automata failures: A calculus and a method
-
July
-
J. P. Roth, "Diagonosis of Automata Failures: A Calculus and a Method," IBM Journal of Research and Development, vol. 10, no. 4, pp. 278-291, July 1966.
-
(1966)
IBM Journal of Research and Development
, vol.10
, Issue.4
, pp. 278-291
-
-
Roth, J.P.1
-
32
-
-
0023865139
-
SOCRATES: A highly efficient automatic test pattern generation system
-
January
-
M. H. Schulz, E. Trischler, and T. M. Serfert, "SOCRATES: A Highly Efficient Automatic Test Pattern Generation System," IEEE Trans. on Computer-Aided Design, vol. CAD-7, no. 1, pp. 126-137, January 1988.
-
(1988)
IEEE Trans. on Computer-aided Design
, vol.CAD-7
, Issue.1
, pp. 126-137
-
-
Schulz, M.H.1
Trischler, E.2
Serfert, T.M.3
-
35
-
-
13244280756
-
A testability measure for register transfer level digital circuits
-
June
-
J. E. Stephenson and J. Grason, "A Testability Measure for Register Transfer Level Digital Circuits," in Proc. of the Int. Symp. on Fault Tolerant Computing, Pittsburgh, PA, June 1976, pp. 101-107.
-
(1976)
Proc. of the Int. Symp. on Fault Tolerant Computing, Pittsburgh, PA
, pp. 101-107
-
-
Stephenson, J.E.1
Grason, J.2
-
36
-
-
0034250207
-
IGRAINE - An implication graph based engine for fast implication, justification and propagation
-
August
-
P. Tafertshofer, A. Ganz, and K. J. Antreich, "IGRAINE - An Implication GRaph bAsed engINE for Fast Implication, Justification and Propagation," IEEE Trans. Computer-Aided Design, vol. 19, no. 8, pp. 648-655, August 2000.
-
(2000)
IEEE Trans. Computer-aided Design
, vol.19
, Issue.8
, pp. 648-655
-
-
Tafertshofer, P.1
Ganz, A.2
Antreich, K.J.3
-
37
-
-
0031341194
-
A SAT-based implication engine for efficient ATPG, equivalence checking and optimization of netlists
-
November
-
P. Tafertshofer, A. Ganz, and M. Henftling, "A SAT-Based Implication Engine for Efficient ATPG, Equivalence Checking and Optimization of Netlists," in Proc. of the International Conf. on Computer-Aided Design, November 1997, pp. 648-655.
-
(1997)
Proc. of the International Conf. on Computer-aided Design
, pp. 648-655
-
-
Tafertshofer, P.1
Ganz, A.2
Henftling, M.3
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