A Functional Decomposition Method for Redundancy Identification and Test Generation

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 10, Issue 3, 1997, Pages 175-195

  Bushnell, Michael L ^a,c   Giraldi, John ^b,d  

^a RUTGERS UNIVERSITY   (United States)

^b JXG Consulting   (United States)

^c CARNEGIE MELLON UNIVERSITY   (United States)

^d RUTGERS UNIVERSITY   (United States)

Author keywords

Automatic test generation; Backtracing; Logic testing; Redundancy identification

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; COMBINATORIAL CIRCUITS; COMPUTER SOFTWARE; FAILURE ANALYSIS; REDUNDANCY;

AUTOMATIC TEST PATTERN GENERATION (ATPG); REDUNDANCY IDENTIFICATION; SOCRATES ALGORITHMS; SOFTWARE PACKAGE EST; TOPS ALGORITHMS;

ELECTRONIC EQUIPMENT TESTING;

EID: 0031163938     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008207423859     Document Type: Article

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