Novel evaluation of intra-grain defects in polycrystalline silicon solar cells using light emission

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2005, Pages 1346-1348

  Kaji, Yasue ^a   Kondo, Hayato ^a   Takahashi, Yu ^a   Yamazaki, Tsutomu ^a   Uraoka, Yukiharu ^a   Fuyuki, Takashi ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE DEFECTS; PHOTOGRAPHIC SURVEYING;

ELECTRIC FIELDS; LIGHT EMISSION; POLYCRYSTALLINE MATERIALS; RADIATION; SOLAR CELLS; SURVEYS;

DEFECTS;

EID: 27944467228     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2005.1488391     Document Type: Conference Paper

References (3)

1. R. Shimokawa et al., J. Appl. Phys. 59, 1986, pp. 2571.
2. A. McHugo et al., Appl. Phys. Lett. 72, 1998 pp. 3482.
3. N. Akil et al., "Modeling of light-emission spectra measured on silicon nanometer-scale diode antifuses", J. Appl. Phys. 88, 2000, pp. 1916-1922.