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Volumn 124-125, Issue SUPPL., 2005, Pages 245-248

Boron diffusion in amorphous silicon

Author keywords

Amorphous; Boron; Silicon

Indexed keywords

ACTIVATION ENERGY; AMORPHIZATION; BORON; COMPUTATIONAL METHODS; COMPUTER SIMULATION; CRYSTALLINE MATERIALS; DIFFUSION; EPITAXIAL GROWTH; ION IMPLANTATION;

EID: 27844454291     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2005.08.079     Document Type: Conference Paper
Times cited : (26)

References (11)
  • 8
    • 85166092162 scopus 로고    scopus 로고
    • note
    • In the simulation, diffusion length and solid solubility are fitting parameters to minimize the difference between the simulated and annealed profile for a given region of interest (ROI). In this work the region of interest was the shoulder region; portion of the profile between 10 and 20 nm depth. Fitting with and without concentration enhancement resulted in a different concentration of mobile B to reproduce best the experimental data in the ROI. This is observed as a different position of the simulated profile kink.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.