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27744576008
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7 The aim of pattern decomposition/profile fitting is to fit the complete experimental powder X-ray diffraction profile by refinement of variables that describe peak positions, background intensity distribution, peak widths, peak shapes, and peak intensities. No structural model is used in this fitting process (except insofar as the unit cell parameters determined in the indexing stage are used to establish the initial peak positions), and the peak intensities are simply a set of intensity variables that are refined to give optimal fit to the experimental powder X-ray diffraction pattern without reference to any structural model. Clearly, the pattern decomposition/profile fitting procedure establishes a limit to the quality of fit that could be obtained in a Rietveld refinement calculation for the same experimental powder X-ray diffraction pattern (taken over the same 2θ range). In Rietveld refinement, the peak intensities are tied to a structural model and are therefore not independent refinable variables.
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2542550605
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27744535910
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Cardiff University and University of Birmingham
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EAGER-A Computer Program for Direct-Space Structure Solution from Powder X-ray Diffraction Data
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25
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27744453733
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-1, which may suggest that the OH group is involved in hydrogen bonding.
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-
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26
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27744557719
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note
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2 bonds relative to the orientation of the C(4)-H bond of the central phenyl ring.
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27
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27744505230
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note
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3 bonds relative to the orientation of the C(4)-O bond of the peripheral phenyl rings.
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28
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