Scanning electron microscope and x-ray diffraction studies on the lattice constant of spin-coated Zn1-xMgxO thin films of sol-gel method

Surface Review and Letters

Volumn 12, Issue 4, 2005, Pages 605-610

  Rusop, M ^a   Uma, K ^a   Soga, T ^a   Jimbo, T ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Lattice constant; Sol gel; Spin coating; X ray diffraction; Zinc oxide; Zn 1 xMgxO

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; FILM GROWTH; LATTICE CONSTANTS; MAGNESIA; SCANNING ELECTRON MICROSCOPY; SPIN COATING; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

GLASS SUBSTRATES; MONOETHANOLAMINE; ZINC ACETATE DIHYDRATE;

THIN FILMS;

EID: 27744504695     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X05007499     Document Type: Article

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