Au/SiO2 Nanosystems by XPS

Surface Science Spectra

Volumn 10, Issue 1, 2003, Pages 21-31

  Barreca, Davide ^a   Bovo, Antonia ^b   Gasparotto, Alberto ^b   Tondello, Eugenio ^b  

^a CNR Consiglio Nazionale delle Ricerche   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; METALLIC FILMS; NANOSYSTEMS; OPTICAL PROPERTIES; SPUTTERING; SURFACE MORPHOLOGY; ULTRAVIOLET VISIBLE SPECTROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

AMORPHOUS SILICA; DEPOSITION EXPERIMENTS; GOLD FILM; R.F. SPUTTERING; RF POWER; RF-POWER; RF-SPUTTERING; SILICA SUBSTRATE; SPUTTERING YIELDS; X-RAY PHOTOELECTRONS;

SILICA;

EID: 27744497727     PISSN: 10555269     EISSN: 15208575     Source Type: Journal    
DOI: 10.1116/11.20040101     Document Type: Article

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