Self-heating characterization and extraction method for thermal resistance and capacitance in high voltage MOSFETs

European Solid-State Device Research Conference

Volumn , Issue , 2003, Pages 449-452

  Anghel, C ^a   Ionescu, A M ^a   Hefyene, N ^a   Gillon, R ^b  

^a EPFL   (Switzerland)

^b ON SEMICONDUCTOR   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXTRACTION METHOD; HIGH VOLTAGE; MOSFETS; SELF-HEATING;

EID: 27744488777     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2003.1256910     Document Type: Conference Paper

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