Structure of [UO2Cl4]2- in acetonitrile

Inorganic Chemistry

Volumn 44, Issue 22, 2005, Pages 7705-7707

  Servaes, Kelly ^a   Hennig, Christoph ^b   Van Deun, Rik ^a   Görller Walrand, Christiane ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 27744445896     PISSN: 00201669     EISSN: None     Source Type: Journal    
DOI: 10.1021/ic051098r     Document Type: Article

References (26)

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12. 3h symmetry in Figure 2.5 (3a) and Figure 6b. This conclusion has been revised in ref 14.
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17. 2O (x = 0, 1, 2, 3, 5, 6, 7) have been reported in the literature. The treatment of the initial solid probably governs the degree of hydration. However, it is very difficult to determine the exact number of water molecules in the uranyl perchlorate salt due to its hygroscopic behavior. Even if we determine the exact number of water molecules, it is always an estimation. Therefore, to have more or less an idea about the uranyl concentration in our samples, we use the molecular weight of the hexahydrate for calculating concentrations (MW 577.02 g/mol). Comparison of the ε values for 5, 6, or 7 water molecules in the uranyl perchlorate salt yields an error of about 3%.
18. 2+ does not exist. However, with the free uranyl ion, we mean the uranyl ion surrounded by only solvent molecules and no ligands.
19. Matz, W.; Schell, N.; Bernhard, G.; Prokert, F.; Reich, T.; Claussner, J.; Oehme, W.; Schlenk, R.; Dienel, S.; Funke, H.; Eichhorn, F.; Betzl, M.; Pröhl, D.; Strauch, U.; Hüttig, G.; Krug, H.; Neumann, W.; Brendler, V.; Reichel, P.; Denecke, M. A.; Nitsche, H. J. Synchrotron Rad. 1999, 6, 1076-1085.
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22. Watkin, D. J.; Denning, R. G.; Prout, K. Acta Crystallogr. 1991, C47, 2517-2519.
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25. Furthermore, XRD reflection intensities are mainly determined by the heavy uranium scatterers, and light scatterers contribute only weak (the heavy-atom problem). This may lead to inaccuracies in bond length determinations by XRD. See: Hennig, C.; Reck, G.; Reich, T.; Rossberg, A.; Kraus, W.; Sieler, J. Z. Kristallogr. 2003, 218, 37-45.
26. 2O is given as Supporting Information.