EXAFS and XRD investigations of zeunerite and meta-zeunerite

Zeitschrift fur Kristallographie

Volumn 218, Issue 1, 2003, Pages 37-45

  Hennig, C ^a   Reck, G ^b   Reich, T ^a   Rossberg A ^a   Kraus, W ^b   Sieler, J ^c  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^c UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ARTICLE; ATOM; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; MEASUREMENT; PRESSURE; TEMPERATURE DEPENDENCE; X RAY DIFFRACTION;

EID: 0037691079     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.218.1.37.20776     Document Type: Article

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