Hartmann-Shack test with random masks for modal wavefront reconstruction

Optics Express

Volumn 13, Issue 23, 2005, Pages 9570-9584

  Soloviev, Oleg ^a   Vdovin, Gleb ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DECOMPOSITION; OPTICAL SENSORS; STATISTICS;

HARTMANN-SHACK TEST; MODAL WAVEFRONT RECONSTRUCTION;

MASKS;

EID: 27744445168     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.009570     Document Type: Article

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