Algorithm to increase the largest aberration that can be reconstructed from hartmann sensor measurements

Applied Optics

Volumn 37, Issue 20, 1998, Pages 4321-4329

  Roggemann, Michael C ^a   Schulz, Timothy J ^a  

^a Michigan Technological University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001081126     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.004321     Document Type: Article

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