Hybrid exchange bias in (FePt-FeMn)N multilayers

IEEE Transactions on Magnetics

Volumn 41, Issue 10, 2005, Pages 2715-2717

  Phuoc, Nguyen N ^b   Suzuki, Takao ^a,b  

^a IEEE

^b TOYOTA TECHNOLOGICAL INSTITUTE   (Japan)

Author keywords

Exchange bias; In plane; Out of plane; Thin film; Unidirectional anisotropy

Indexed keywords

IRON ALLOYS; MAGNETIZATION; MATHEMATICAL MODELS; SPUTTERING; THIN FILMS;

EXCHANGE BIAS; IN-PLANE; OUT-OF-PLANE; UNIDIRECTIONAL ANISOTROPY;

MULTILAYERS;

EID: 27744442481     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2005.854761     Document Type: Article

References (12)

1. W. H. Meiklejohn and C. P. Bean, "A new anisotropy," Phys. Rev., vol. 102, p. 1413, 1956.
2. J. Nogués and I. K. Schuller, "Exchange bias," J. Magn. Magn. Mater., vol. 192, p. 203, 1999.
3. S. Matt, K. Takano, S. S. P. Parkin, and E. E. Fullerton, "Perpendicular exchange bias of Co/Pt multilayers," Phys. Rev. Lett., vol. 87, p. 087 202, 2001.
4. 3/NiO(11 Å multilayers," J. Appl. Phys., vol. 94, p. 1105, 2003.
5. n multilayers," J. Appl. Phys., vol. 93, p. 6841, 2003.
6. S. M. Zhou, L. Sun, P. C. Searson, and C. L. Chien, "Perpendicular exchange bias and magnetic anisotropy in Co/permalloy multilayers," Phys. Rev. B Condens. Mater., vol. 69, p. 024408-1, 2004.
7. A. P. Malozemoff, "Heisenberg-to-Ising crossover in a random-field model with uniaxial anisotropy," Phys. Rev. B Condens. Mater., vol. 37, p. 7673, 1988.
8. 81 : Dependence on temperature, microstructure and antiferromagnetic layer thickness," J. Appl. Phys., vol. 88, p. 975, 2000.
9. M. Ali, C. H. Marrows, and B. J. Hickey, "Onset of exchange bias in ultrathin antiferromagnetic layers," Phys. Rev. B Condens. Mater., vol. 67, p. 172405, 2003.
10. B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction. Englewood Cliffs, NJ: Prentice-Hall, 2001.
11. n /FeMn multilayers with perpendicular magnetic anisotropy," J. Appl. Phys., vol. 91, p. 6905, 2002.
12. 1-x(0 < x < 0.2) bilayers on composition and microstructure," J. Magn. Magn. Mater., vol. 260, p. 273, 2003.