High electron mobility of 0.1 cm2V-1s-1 in the highly ordered columnar phase of hexahexylthiotriphenylene

Applied Physics Letters

Volumn 87, Issue 19, 2005, Pages 1-3

  Iino, Hiroaki ^a   Takayashiki, Yukiko ^a   Hanna, Jun Ichi ^a   Bushby, Richard J ^b   Haarer, Dietrich ^c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b UNIVERSITY OF LEEDS   (United Kingdom)

^c UNIVERSITY OF BAYREUTH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC COMPOUNDS; CARRIER CONCENTRATION; CARRIER MOBILITY; ELECTRON TRANSPORT PROPERTIES; IONIZATION; LIQUID CRYSTALS; PHOTOCURRENTS; TRANSPORT PROPERTIES;

CHARGE CARRIER TRANSPORT; COLUMNAR PHASE; IONIC TRANSPORT; IONIZED IMPURITIES;

ELECTRON MOBILITY;

EID: 27644572665     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2128066     Document Type: Article

References (32)

1. D. Adam, F. Closs, T. Frey, D. Funhoff, D. Haarer, H. Ringsdorf, P. Schuhmacher, and K. Siemensmeyer, Phys. Rev. Lett. 70, 457 (1993).
2. D. Adam, P. Schuhmacher, J. Simmerer, L. Haussling, K. Siemensmeyer, K. H. Etzbach, H. Ringsdorf, and D. Haarer, Nature (London) 371, 141 (1994).
3. N. Boden, R. J. Bushby, J. Clements, M. V. Jesudason, P. F. Knowles, and G. Williams, Chem. Phys. Lett. 152, 94 (1988).
4. D. Markovitsi, T. Tran-Thi, V. Briois, J. Simon, and K. Ohta, J. Am. Chem. Soc. 110, 2001 (1988).
5. H. Fujikake, T. Murashige, M. Sugibayashi, and K. Ohta, Appl. Phys. Lett. 85, 3474 (2004).
6. Y. Yuan, B. A. Gregg, and M. F. Lawrence, J. Mater. Res. 15, 2494 (2000).
7. C. W. Struijk, A. B. Sieval, J. E. J. Dakhorst, M. Dijk, P. Kimkes, R. B. M. Koehorst, H. Donker, T. J. Schaafsma, S. J. Picken, A. M. Craats, J. M. Warman, H. Zuilhof, and E. J. R. Sudholter, J. Am. Chem. Soc. 122, 11057 (2000).
8. A. M. Craats, J. M. Warman, A. Fechtenkötter, J. D. Brand, M. A. Harbison, and K. Müllen, Adv. Mater. (Weinheim, Ger.) 11, 1469 (1999).
9. M. Funahashi and J. Hanna, Phys. Rev. Lett. 78, 2184 (1997).
10. M. Funahashi and J. Hanna, Appl. Phys. Lett. 71, 602 (1997).
11. M. Funahashi and J. Hanna, Appl. Phys. Lett. 73, 3733 (1998).
12. M. Funahashi and J. Hanna, Appl. Phys. Lett. 76, 2574 (2000).
13. S. Mery, D. Haristoy, J. Nicoud, D. Guillon, S. Diele, H. Monobe, and Y. Shimizu, J. Mater. Chem. 12, 37 (2002).
14. S. Mery, D. Haristoy, J. Nicoud, D. Guillon, H. Monobe, and Y. Shimizu, J. Mater. Chem. 13, 1622 (2003).
15. M. Funahashi and J. Hanna, Appl. Phys. Lett. 74, 2584 (1999).
16. K. Kogo, T. Goda, M. Funahashi, and J. Hanna, Appl. Phys. Lett. 73, 1595 (1998).
17. H. Tokuhisa, M. Era, and T. Tsutsui, Appl. Phys. Lett. 72, 2639 (1998).
18. A. M. Van de Craats, N. Stutzmann, O. Bunk, M. M. Nielsen, M. Watson, K. Müllen, H. D. Chanzy, H. Sirringhaus, and R. H. Friend, Adv. Mater. (Weinheim, Ger.) 15, 495 (2003).
19. I. McCulloch, W. Zhang, M. Heeney, C. Bailey, M. Giles, D. Graham, M. Shkunov, D. Sparrowe, and S. Tierney, J. Mater. Chem. 13, 2436 (2003).
20. L. Schmidt-Mende, A. Fechtenkötter, K. Müllen, E. Moons, R. H. Friend, and J. D. MacKenzie, Science 293, 1119 (2001).
21. S. F. Nelson, Y.-Y. Lin, D. J. Gundlach, and T. N. Jackson, Appl. Phys. Lett. 72, 1854 (1998).
22. F. Garnier, G. Horowitz, X. Peng, and D. Fichou, Adv. Mater. (Weinheim, Ger.) 2, 592 (1990).
23. H. Maeda, M. Funahashi, and J. Hanna, Mol. Cryst. Liq. Cryst. 346, 183 (2000).
24. H. Iino, J. Hanna, and D. Haarer, Phys. Rev. B (to be published).
25. H. Iino, J. Hanna, C. Jäger, and D. Haarer, Mol. Cryst. Liq. Cryst. 436, 1131 (2005).
26. Y. Maeda, D. S. S. Rao, S. K. Prasad, S. Chandrasekhar, and S. Kumar, Liq. Cryst. 28, 1679 (2001).
27. M. Funahashi and J. Hanna, Chem. Phys. Lett. 397, 319 (2004).
28. H. Ahn, A. Ohno, and J. Hanna, Jpn. J. Appl. Phys., Part 1 44, 3764 (2005).
29. H. Iino and J. Hanna, J. Phys. Chem. B (to be published).
30. P. W. Atkins, Physical Chemistry, 6th ed. (Oxford University Press, Oxford, 1998), p. 750.
31. CRC Handbook of Chemistry and Physics (CRC Press, Boca Raton, Washington, DC, 1982).
32. T. Kamitani, M. Funahashi, and J. Hanna, in Proceedings of the 17th International Conference on Nonimpact Printing Technologies (The Society for Imaging Science and Technology, 2001), p. 546.