Detection of trace amount of impurity in smectic liquid crystals

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 6 A, 2005, Pages 3764-3768

  Ahn, Hyonsoo ^a   Ohno, Akira ^a   Hanna, Jun Ichi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Charge transport; Impurity; Liquid crystal; Organic semiconductor; Time of flight method (TOF)

Indexed keywords

HEAT CONDUCTION; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; IMPURITIES; IONIZATION; LIQUID CRYSTALS; SEMICONDUCTING ORGANIC COMPOUNDS;

CHARGE TRANSPORT; IMPURITY SYSTEMS; TIME OF FLIGHT METHOD (TOF);

SMECTIC LIQUID CRYSTALS;

EID: 23944490623     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.3764     Document Type: Article

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