Model of dopant action in oxide cathodes

Applied Surface Science

Volumn 251, Issue 1-4, 2005, Pages 50-58

  Den Engelsen, Daniel ^a   Gaertner, Georg ^b  

^a Product and Process Development   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

Diffusion; Doping; Electrical conductivity; Electrolysis; Oxide cathode; Poisoning; Semi conductor impurity levels

Indexed keywords

DIFFUSION; DOPING (ADDITIVES); ELECTROLYSIS; OXIDES; RARE EARTHS; SENSITIVITY ANALYSIS; SINTERING;

DOPANT ACTION; OXIDE CATHODES; POISONING;

CATHODES;

EID: 27544494212     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.03.181     Document Type: Conference Paper

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