Direct determination of electrical conductivity of oxide cathodes

Applied Surface Science

Volumn 201, Issue 1-4, 2002, Pages 35-40

  Gartner G ^a   Janiel, P ^a   Raasch, D ^a  

^a PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

Critical dc current density; Electrical conductivity; Electron emission cooling; Oxide cathodes; Rare earth dopants; Semiconductor model; Thermionic emission

Indexed keywords

CATHODES; COOLING; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRIC CONDUCTIVITY; PARAMETER ESTIMATION; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DOPING; THERMAL EFFECTS; ULTRAHIGH VACUUM;

RARE EARTH DOPANTS;

SURFACE REACTIONS;

EID: 0037202579     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00251-9     Document Type: Article

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