Method to detect the property of complex oxide structure formed by AFM anodic oxidation completely

Ultramicroscopy

Volumn 105, Issue 1-4, 2005, Pages 111-114

  Dengfeng, Kuang ^a   Qinggang, Liu ^a   Weilian, Guo ^a   Shilin, Zhang ^a   Xiaotang, Hu ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

AFM anodic oxidation; Conductivity; Nano oxide structure; Nanotitanium film

Indexed keywords

ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; MIM DEVICES; THIN FILMS; TITANIUM;

AFM ANODIC OXIDATION; CONDUCTIVITY; NANO-OXIDE STRUCTURE; NANOTITANIUM FILMS;

NANOSTRUCTURED MATERIALS;

METAL; OXIDE; TITANIUM; TITANIUM DIOXIDE;

ATOMIC FORCE MICROSCOPY; CALCULATION; CHEMICAL STRUCTURE; CONFERENCE PAPER; DEVICE; FILM; MICROSCOPE; OXIDATION; STRUCTURE ANALYSIS; THEORETICAL STUDY; THICKNESS;

EID: 27544433026     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.06.025     Document Type: Conference Paper

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