Optical phonon frequencies and damping in AlAs, GaP, GaAs, InP, InAs and InSb studied by oblique incidence infrared spectroscopy

Solid State Communications

Volumn 136, Issue 7, 2005, Pages 404-409

  Lockwood, D J ^a   Yu, Guolin ^a   Rowell, N L ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

A. Semiconductors; D. Phonons; E. Light reflection

Indexed keywords

ALUMINUM COMPOUNDS; DAMPING; INFRARED SPECTROSCOPY; REFLECTION; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING INDIUM COMPOUNDS; ZINC COMPOUNDS;

LO PHONON LINE WIDTHS; OPTICAL PHONONS; REFLECTIVITY MEASUREMENTS; ZINCBLENDE SEMICONDUCTORS;

PHONONS;

EID: 27344453065     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2005.08.030     Document Type: Article

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