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Volumn 2, Issue 4, 2005, Pages 1418-1422
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Influence of the low energy ion beam milling on the electrical properties of InSb
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Author keywords
[No Author keywords available]
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Indexed keywords
ARGON;
CRYSTAL LATTICES;
ELECTRON MOBILITY;
ION BEAMS;
ION BOMBARDMENT;
IONS;
MILLING (MACHINING);
CRYSTAL LATTICE DAMAGES;
ION BEAM MILLING;
LOW MOBILITY ELECTRONS;
SURFACE AMORPHISATION;
SEMICONDUCTING INDIUM COMPOUNDS;
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EID: 27344451695
PISSN: 16101634
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1002/pssc.200460478 Document Type: Conference Paper |
Times cited : (5)
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References (8)
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