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Volumn 2, Issue 4, 2005, Pages 1418-1422

Influence of the low energy ion beam milling on the electrical properties of InSb

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CRYSTAL LATTICES; ELECTRON MOBILITY; ION BEAMS; ION BOMBARDMENT; IONS; MILLING (MACHINING);

EID: 27344451695     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200460478     Document Type: Conference Paper
Times cited : (5)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.