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Volumn 96, Issue 11, 2004, Pages 6789-6793

The role of N-related point defects in the degradation process of ZnSe-based white light-emitting diodes

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); DEGRADATION; DISLOCATIONS (CRYSTALS); HEAT TREATMENT; HOLE TRAPS; LIGHT EMITTING DIODES; STACKING FAULTS; ZINC COMPOUNDS;

DARK SPOTS; ELECTRONIC SIGNS; JUNCTION DIODES; THREADING DISLOCATIONS;

POINT DEFECTS;

EID: 27344439608 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1808901 Document Type: Article

Times cited : (6)

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