Refractive index and birefringence of inxGa1-xN films grown by MOCVD

Physica Status Solidi C: Conferences

Volumn 2, Issue 7, 2005, Pages 2783-2786

  Sanford, N A ^a   Munkholm, A ^b   Krames, M R ^b   Shapiro, A ^a   Levin, I ^a   Davydov, A V ^a   Sayan, S ^a,c   Wielunski, L S ^c   Madey, T E ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Philips Lumileds Lighting Company   (United States)

^c RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; CRYSTAL GROWTH; EMISSION SPECTROSCOPY; GALLIUM COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL WAVEGUIDES; REFRACTIVE INDEX; RUTHERFORD BACKSCATTERING SPECTROSCOPY;

FIELD-EMISSION SCANNING ELECTRON MICROSCOPY (FESEM).; OPTICAL SCATTERING EFFICIENCY; PRISM COUPLING;

THIN FILMS;

EID: 27344439070     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200461606     Document Type: Conference Paper

References (3)

1. N. A. Sanford, L. H. Robins, A. V. Davydov, A. Shapiro, D. V. Tsvetkov, A. V. Dmitriev, S. Keller, U. K. Mishra, and S. P. DenBaars, J. Appl. Phys. 94, 2980 (2003)
2. I. Akasaki and H. Amano in: Semiconductors and Semimetals Vol. 50, edited by J. Pankove and T. Moustakas (Academic Press, New York, 1998), p. 459-412.
3. R. Goldhahn, S. Shokhovets, J. Scheiner, G. Gobsch, T. S. Cheng, C. T. Foxon, U. Kaiser, G. D. Kipshidze, and W. Richter, phys. stat. sol. (a) 177, 107 (2000).