Quantification of irradiation damage generated during HRTEM with 1250 keV electrons

Ultramicroscopy

Volumn 63, Issue 1, 1996, Pages 49-55

  Dehm, G ^a   Nadarzinski, K ^a   Ernst, F ^a   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYSTAL DEFECTS; ELECTRONS; IMAGE ANALYSIS; INTERFACES (MATERIALS); IRRADIATION; NICKEL ALLOYS; RADIATION DAMAGE; SAPPHIRE;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IRRADIATION DAMAGE; NICKEL ALUMINIDE;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; MEASUREMENT; RADIATION INJURY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030128782     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00025-3     Document Type: Article

References (11)

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