Comparison of electrical properties of (100) / (001)-oriented epitaxial Pb(Zr0.35, Ti0.65)O3 thin films with the same (001) domain fraction grown on (100)Si and (100)SrTiO3 substrates

Applied Physics Letters

Volumn 87, Issue 18, 2005, Pages 1-3

  Kim, Yong Kwan ^a   Morioka, Hitoshi ^a,c   Okamoto, Shoji ^a   Watanabe, Takayuki ^a   Yokoyama, Shintaro ^a   Sumi, Akihiro ^a   Funakubo, Hiroshi ^a   Saito, Keisuke ^b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b BRUKER AXS INC   (United States)

^c Elpida Memory Inc   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC LOSSES; ELECTRIC FIELDS; ELECTRIC PROPERTIES; METALLORGANIC CHEMICAL VAPOR DEPOSITION; STRONTIUM COMPOUNDS; VOLUME FRACTION;

DOMAIN STRUCTURE; EPITAXIAL FERROELECTRIC FILMS; REMANENT POLARIZATION;

THIN FILMS;

EID: 27344437864     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2117628     Document Type: Article

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