Anisotropy of infrared absorption in (110) porous silicon layers

Physica Status Solidi C: Conferences

Volumn 2, Issue 9, 2005, Pages 3461-3465

  Timoshenko, V Yu ^a   Osminkina, L A ^a   Efimova, A I ^a   Fomenko, M A ^a   Golovan, L A ^a   Kashkarov, P K ^a   Kovalev, D ^b   Kunzner N ^b   Gross, E ^b   Diener, J ^b   Koch, F ^b  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ANISOTROPY; BIREFRINGENCE; CHARGE CARRIERS; INFRARED RADIATION; LIGHT POLARIZATION; NANOSTRUCTURED MATERIALS;

ABSORPTION DICHROISM; CARRIER SCATTERING; INFRARED ABSORPTION (IR) SPECTROSCOPY; SURFACE BOND VIBRATIONS;

POROUS SILICON;

EID: 27344434272     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200461221     Document Type: Conference Paper

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