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Volumn 44, Issue 5, 2002, Pages 811-815
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Study of birefringence in porous silicon layers by IR Fourier spectroscopy
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0036014704
PISSN: 10637834
EISSN: None
Source Type: Journal
DOI: 10.1134/1.1477477 Document Type: Article |
Times cited : (33)
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References (14)
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