Measurement of diffuse electron scattering by single nanometre-sized defects in gold

Philosophical Magazine

Volumn 85, Issue 4-7 SPEC. ISS., 2005, Pages 497-507

  Kirk, M A ^a   Davidson, R S ^a   Jenkins, M L ^b   Twesten, R D ^c  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; DISLOCATIONS (CRYSTALS); GOLD; IRRADIATION; POINT DEFECTS;

DIFFUSE ELASTIC SCATTERING; LATTICE PLANE; NANOMETERS;

ELECTRON SCATTERING;

EID: 27144492738     PISSN: 14786435     EISSN: 14606992     Source Type: Journal    
DOI: 10.1080/02678370412331320189     Document Type: Conference Paper

References (12)

1. M.L. Jenkins and M.A. Kirk, Characterization of Radiation Damage by Transmision Electron Microscopy (Inst. of Physics Publishing, Bristol, 2001).
2. P. Ehrhart, J. Nucl. Mater. 69/70 200 (1978).
3. P.H. Dederichs, Phys. Rev. B 4 1041 (1971).
4. H. Trinkaus, Phys. Stat. Sol. B 54 209 (1972).
5. B.C. Larson and F.W. Young, Jr., Phys. Stat. Sol A 104 273 (1987).
6. S.M. Ohr, Phys. Stat. Sol. B 64 317 (1974).
7. K. Nordlund, P. Partyka, R.S. Averback, et al., J. Appl. Phys. 88 2278 (2000).
8. P. Partyka, Y. Zhong, K. Nordlund, et al., Phys. Rev. B 64 235207-1 (2001).
9. P. Ehrhart, H. Trinkaus and B.C. Larson, Phys. Rev. B 25 834 (1982).
10. M.A. Kirk, R. Twesten, S.P. Martin, et al., Microsc. Microanal. 8 suppl. 2 622CD (2002).
11. M.L. Jenkins, Phil. Mag. 29 813 (1974).
12. A.Y. Stathopoulos, Phil. Mag. A 44 285 (1981).