Contributions of inelastically scattered electrons to defect images

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 622-623

  Kirk, Marquis A ^a   Twesten, Ray ^b   Martin, Stephen P ^c   Hetherington, Crispin J D ^c   Jenkins, Michael L ^c  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^c UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036409208     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602106052     Document Type: Conference Paper

References (4)

1. Characterization of Radiation Damage by Transmission Etectron Microscopy, M. L. Jenkins and M. A. Kirk, Inst. Phys. Publ., Bristol, UK, 2001, pp. 1-224.
2. S. L. Cundy, A. Howie and U. Valdre', Phil. Mag. 20 (1969) 147.
3. C. J. Humphreys and M. J. Whelan, Phil. Mag. 20 (1969) 165.
4. This research is supported by the U.S. Department of Energy, Office of Science, and the Department of Materials, University of Oxford, UK.