Microstructure control of sputtered Ba2TiSi2O 8 films by sol-gel-derived underlayer

Journal of Crystal Growth

Volumn 285, Issue 1-2, 2005, Pages 117-122

  Zhu, Mankang ^a   Dai, Wukun ^a   Hou, Yudong ^a   Yan, Hui ^a   Xu, J B ^b  

^a BEIJING UNIVERSITY OF TECHNOLOGY   (China)

^b CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

A1. Surface structure; A3. Physical vapor deposition deposition process; B1. Fresnoite; B2. Ferroelectric materials

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; CRYSTALLINE MATERIALS; FERROELECTRIC MATERIALS; GRAIN BOUNDARIES; MAGNETRON SPUTTERING; MORPHOLOGY; PHYSICAL VAPOR DEPOSITION; RAMAN SCATTERING; SOL-GELS; SURFACE STRUCTURE; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINITY; FRESNOITES; MICROSTRUCTURE CONTROL; SHARP BOUNDARIES;

BARIUM COMPOUNDS;

EID: 27144435852     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.08.004     Document Type: Article

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