Self-refereed on-chip jitter measurement circuit using vernier oscillators

Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI

Volumn , Issue , 2005, Pages 218-223

  Xia, Tian ^a   Zheng, Hao ^b   Li, Jing ^c   Ginawi, Ahmed ^c  

^a UNIVERSITY OF VERMONT   (United States)

^b UNIVERSITY OF SOUTH FLORIDA   (United States)

^c IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FINE RESOLUTION; JITTER DISTRIBUTION; JITTER MEASUREMENT; VERNIER OSCILLATOR;

ELECTRON DEVICE TESTING; NETWORKS (CIRCUITS); OSCILLATORS (ELECTRONIC); SIGNAL PROCESSING; SYSTEMS ANALYSIS;

JITTER;

EID: 26844552486     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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