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Volumn , Issue , 2005, Pages 443-446
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New fatigue damage evaluation of MEMS materials under tension-compression cyclic loading
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Author keywords
[No Author keywords available]
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Indexed keywords
ELASTIC HYSTERESIS;
FATIGUE DAMAGE;
LASER REFLECTION;
SINGLE CRYSTAL SILICON (SCS);
BENDING (DEFORMATION);
COMPRESSION TESTING;
COMPRESSIVE STRESS;
CYCLIC LOADS;
FATIGUE OF MATERIALS;
HYSTERESIS;
LIGHT REFLECTION;
SILICON;
SINGLE CRYSTALS;
TENSILE TESTING;
MICROELECTROMECHANICAL DEVICES;
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EID: 26844480323
PISSN: 10846999
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (5)
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